Back ] Up ] Next ]

Sensitivity Issues in Step-Scan FT-IR Spectrometry

It is the large frequency separation between adjacent spectral elements that produces the excellent noise immunity of rapid-scan FT-IR. Jim Chao really hit the nail on the head when he pointed this out in 1987. It is precisely because rapid-scan works so well that we have overlooked the root problems in step-scan for so long.

 
Home - Polymer Modulator ™ - Rotating Interferometers - Step-scan Technology
Signal Processing Technology - MAT T-shirts - Bibliography - Links - Private Idaho
Copyright 1995-2000 All Rights Reserved / webmaster@appl-tech.com